MIME 569 — Electron Beam Analysis of Materials

Emphasis on operation of scanning and transmission electron microscopes. Topics covered are electron/specimen interactions, hardware description; image contrast description; qualitative and quantitative (ZAF) x-ray analysis; electron diffraction pattern analysis.

• Credits: 3
• Faculty: Faculty of Engineering
• Department: Mining & Materials Engineering
• Taught by: Raynald Gauvin
• Prerequisite: MIME 317

Sections offered

• Section 001 (Lec), Mon Wed 8:35-9:55 am — 8 seats open
• Section 002 (Lec), Mon Wed 8:35-9:55 am — 0 seats open